Low-Temperature AFM Instrumentation

Cryogenic scanning probe workflows for silicon nanodevices (quantum-device-adjacent measurement)

EngineeringPhysics
AFMCryogenicsDAQPythonLabVIEWSignal Processing

Problem

Low-temperature scanning probe experiments are unforgiving: you’re balancing mechanical stability, thermal constraints, low-noise wiring, and measurement throughput, all while making sure the data is interpretable and repeatable. The goal here was not “one-off results,” but a system and workflow that behaves predictably and can be extended.

What I worked on

System overview

Architecture (high level)

  • Environment: cryogenic operation (low-temperature constraints drive everything)
  • Probe + mechanics: stability and vibration awareness; careful mechanical choices
  • Electronics: low-noise wiring/grounding mindset; avoid “mystery coupling”
  • Acquisition: DAQ/configuration + scripted routines for repeatability
  • Analysis: fast feedback loop via Python (plots that catch bad runs early)

On purpose, this page stays at a “systems engineering” level rather than listing sensitive lab details. The key message is how the work was approached: stability, noise-awareness, automation for reliability, and analysis-driven iteration.

Technical skills demonstrated

Engineering

Instrumentation debugging DAQ systems Experimental control Signal integrity mindset Documentation

Computation

Python Data analysis Visualization Automation Reproducible workflows

Why this matters (industry framing)

This work is fundamentally about building measurement systems that other people can trust. That translates directly to industry R&D: integrating hardware and software, managing constraints, debugging real systems, and delivering workflows that are repeatable, documented, and maintainable.

Links